Static can kill delicate electronics
Static can kill delicate electronics. From Cray Channels CC_V4_N4 “Cray Research’s new system test equipment focuses on quality.” The company’s newly-established in house system test facility includes a JEOL Scanning Electron Microscope (SEM) and a Tracor Northern Xray spectrum analyzer. The SEM and X-ray spectrum analyzer units together offer an extremely wide magnification range (10 to 180,000 times […]
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